EDN

What DFT history teaches us

Reading Dan Strassberg’s 1988 article “Pioneering engineers begin to adopt board-level automatic test generation” (PDF) made me realize that there are two DFT-related rules for success that are as ...
Semiconductor Engineering

Building Bridges: A New DFT Paradigm

Over the last twenty years, structural testing with scan chains has become pervasive in chip design methodology. Indeed, it’s remarkable to think that most electronic devices we interact with today ...
EDN

ITC: DeFacTo unveils DFT product that eliminates need for gate-level scan

DeFacTo Technologies announced at the International Test Conference a new DFT product that analyzes a register-transfer level (RTL) integrated-circuit design, creates appropriate RTL scan-test ...
Design-Reuse

DeFacTo Unveils New Design for Test Product that Eliminates Need for Gate-level Scan; Creates Industry's First High-level DFT Sign-off Methodology

HiDFT-Scan Analyzes, Implements Scan Test Structures in Register-Transfer Level Designs; Closes Historical Gap between RTL and DFT PALO ALTO, Calif.--October 22, 2007--DeFacTo Technologies today ...